Scanning Electron Microscopy and X-ray Microanalysis: Third Edition

Price: $119.99


Deal: $66.01 (SAVE Now!)

as of 12/02/2020 (Details)


This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Technical Details

No features available.

Do you want ot get the Scanning Electron Microscopy and X-ray Microanalysis: Third Edition?

Learn more

Deals